DETERMINATION OF GENETIC POLYMORPHISM OF DN GENES IN WHEAT CULTIVARS RESISTANT TO RUSSIAN WHEAT APHID (Diuraphis noxia)
UMIDJON BAKHODIROV *
Institute of Genetics and Plants Experimental Biology, Academy of Sciences of Uzbekistan, Tashkent Region, Kibray District, Yukori-Yuz 111226, Uzbekistan
SAIDMUROT BABOEV
Institute of Genetics and Plants Experimental Biology, Academy of Sciences of Uzbekistan, Tashkent Region, Kibray District, Yukori-Yuz 111226, Uzbekistan
SODIR MELIEV
Institute of Genetics and Plants Experimental Biology, Academy of Sciences of Uzbekistan, Tashkent Region, Kibray District, Yukori-Yuz 111226, Uzbekistan
FARRUX MATKARIMOV
Department of Biology, Chirchik State Pedagogical Institute, Tashkent Region, Chirchik City, Amir Temur 111700, Uzbekistan
*Author to whom correspondence should be addressed.
Abstract
Grain aphids reduce wheat yield by 30 to 75%. As a result of absorption of plant sap by aphids from the leaves and ears of grain crops, the crops become stunted, and in some cases no ear emergence is observed. Accordingly, this leads to a sharp decrease in the quantity and quality of the yield. In order to determine the genetic polymorphisms of resistance to grain aphids, among 38 samples of local landrace, СIMMYT and local wheat varieties of bread wheat grown in Uzbekistan, 9 SSR primers and PCR amplifications were performed, and this article presents an analysis of these PCR results. Resistance to Russian wheat aphids has been identified in 6 of the Dn genes, namely Dn1, Dn2, Dn4, Dn5, Dn6 and Dn8 genes, and the genotypic polymorphism was studied to be 60%.
Keywords: Diuraphis noxia, T. aestivum L, wheat, variety, marker, resistance.